May 26, 2017
Credit: Gordon P. Lee University of Hawaii Physical Electronics Laboratory Honolulu, Hawaii, USA
Subject Matter: Etched-enhanced stacking faults in silicon wafer surface (50x)
Technique: Differential Interference Contrast
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Credit: Gordon P. Lee University of Hawaii Physical Electronics Laboratory Honolulu, Hawaii, USA
Subject Matter: Etched-enhanced stacking faults in silicon wafer surface (50x)
Technique: Differential Interference Contrast
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Credit: William Edward Schadel Small Wonder Enterprises Raleigh, North Carolina, USA
Subject Matter: Sulfur and ketone crystals (20x)
Technique: Polarized Light