Jan 7, 2020
A promising solution : Memory BIST (Built-in Self-test), BIRA and BISR which adds test and repair circuitry to the memory and provides an acceptable yield. In the coming years, Moore’s law will be driven by memory technologies that focus on aggressive pitch scaling and higher transistor count.
MBIST is a self-testing and repair mechanism which tests the memories through an effective set of algorithms to detect possibly all the faults that could be present inside a typical memory cell whether it is stuck-at (SAF), transition delay faults (TDF), coupling (CF) or neighborhood pattern sensitive faults (NPSF). It uses an inbuilt clock, address and data generators and also read/write controller logic, to generate the test patterns for the test.
