Emulsion Polymerization Methods and Nanomaterials - Park Systems Webinar series

Nano World - What is NANO? How small is nano?

Stay up to Date on the Newest AFM Technology by Purchasing from Park Systems

Keeping your research facility up to date on the newest and best technology is key to ensuring you have the best researching abilities possible. Of course, you clearly want to purchase any new devices from a reputable manufacturer that offers the best in microscopy products. A leader in the industry today is Park Systems, who are revolutionizing the atomic force microscopy world and bringing out new products every year. Amongst their many quality products are their Electron Tunneling Microscopes which have created researching capabilities that were once thought of as impossible.

Electron Tunneling Microscopes is one of the application modes that Park Systems offers that started it all for their atomic force microscopes today. This scanning technique was invented in 1981 by Gerd Binnig and Heinrich Rohrer at IBM Zurich. This was the first instrument used to generate real-space images of surfaces with atomic resolution. It was this basic technique that has been the steppingstone that has created Park Systems itself and has led to constant advancements.

When using Electron Tunneling Microscopes, you will do so similar to AFM in that a bias voltage is applied between the tip and the sample. This will result in a tunneling current which varies with tip to sample spacing, but this must be between two conductors or semiconductors, never an insulating material. The schematics of these devices are constant-height or constant-current modes which will vary based on the topography of the surface. Each of these modes have advantages and disadvantages that you must learn about to get the best results.

In essence, the constant-height mode is faster because the system does not require the scanner to go up and down. However, it provides useful information that is only relative to smoother surfaces. On the other hand, constant-current mode can measure irregular surfaces with a higher precision. While this mode can take more time to achieve comparatively; however, you can learn more about these modes on the Park Systems website.

“Our electron tunneling microscopes allow you to bring the sensitivity of AFM to electronic structure and can be a tremendous advantage for many research facilities. These devices can be used as a surface analysis tool that probes the electronic properties of a sample’s surface with the atomic resolution you need. We have worked diligently over the years to ensure that our devices are amongst the best in the industry today. To learn more about adding any of our devices to your facility, please feel free to visit our website today,” states Keibock Lee, President of Park Systems.

Park Systems Webinar - Surface Plasmon Resonance Spectroscopy Tandem with AFM

Park Systems Webinar

Park Systems is a world leading manufacturer of atomic force microscopy systems AFM System provides the most accurate and yet very easy to use AFMs, with revolutionary features.

Park Systems Webinar: Electrochemical Atomic Force Microscopy (EC-AFM)

The applications staff of Park Systems is proud to present an introduction to electrochemical atomic force microscopy (EC-AFM), a characterization technique derived from Atomic Force Microscopy (AFM) that can observe the nanostructures formed on electrode surfaces during electrochemical reactions.

   In EC-AFM, users typically perform voltammetry and corrosion experiments using an electrochemistry cell and a choice of potentiostat or galvanostat depending on the electrochemical application of interest.