#atomicforcemicroscopemanufacturer

Atomic Force Microscope

Do you want to learn basic concepts of AFM operation? Attend two-day AFM course with lab work on atomic force microscopy operation.

Atomic Force Microscopy

We offer Atomic Force Microscopy service, maintenance, support; advanced customization and flexible custom engineering of Atomic Force Microscopes (AFMs) for Original Equipment Manufacturers (OEMs) and AFMWorkshop customers.  

Atomic Force Microscopes have a range of applications from nanotechnology and biology to engineering and semiconductors. AFMs are an essential technology applied by scientists and researchers for visualizing nanostructures and making measurements at the nanoscale including surface roughness and step-height measurements.

Atomic Force Microscopes

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning.

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning.

Atomic Force Microscopes

Life Sciences AFM For soft-sample applications: The LS-AFM is used in life sciences applications when an inverted optical microscope is required for locating cells or other bio-materials on a surface. The LS-AFM can be retrofitted to almost any inverted optical microscope, or it can be purchased with the AFMWorkshop inverted optical microscope.

Atomic Force Microscope for Routine Scanning and Education

Basic Atomic Force Microscope for routine scanning and education: The B-AFM is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM.

The TT-2 AFM is ideal for instrument builders who want to use an Atomic Force Microscope as a platform for creating new instrumentation (such as a new imaging mode), or who want to use an Atomic Force Microscope in combination with another analytical instrument.