#affordableatomicforcemicroscope

The NP-AFM is a nanoprofiler for analysis of features such as surface roughness and metrology of technical samples. Primary applications for the NP-AFM include process development and process control of technical samples.

Nano-Profiler AFM Overview

The NP-AFM is a complete nanoprofiler tool including everything required for scanning samples: microscope stage, electronic box, control computer, probes, manuals, and a video microscope. Samples as large as 200 mm X 200 mm X 20 mm are profiled by the NP-AFM system, and several stage options are available for many types of samples. The Nano-Profiler AFM is primarily used for routine scanning of technical samples such as wafers and disks or for nanotechnology research.

Key Features of the NP-AFM        

Nano-Profiling AFM  

The NP-AFM accommodates industry-standard sized probes and is used for profiling technical samples including wafers and disks in industry applications.

Standard Operating Modes  

Vibrating mode is used for high resolution and soft samples, while non-vibrating mode can be used for routine scanning. Also included with the system are phase and lateral force modes.

Three Sample Stage Options            

Three sample stage options can accommodate different samples with sizes as large as 200mm X 200mm X 20mm.

Linearized X, Y Piezoelectric Scanner          

Piezoelectric X and Y scanners incorporate strain gauges that provide linear scans and rapid zoom-to-feature capabilities.

Direct-Drive Tip Approach

A linear motion stage is used to move the probe perpendicular to the sample. Probe angle alignment is not required, facilitating a much faster probe approach.

LabVIEW Operation  

Industry standard programming environment, functions include setting scanning parameters, probe approach, frequency tuning, and displaying images in real time. Compatible with older operating systems as well.

Video Microscope    

The video optical microscope in a NP-2 AFM serves three functions: aligning the laser onto the cantilever in the light lever AFM, locating surface features for scanning, and facilitating probe approach.

NP-AFM Capabilities

Visualization of Surface Features    

Visualization of surface features can help understand why a process is working or not working. AFM offers extreme contrast on flat samples often encountered in industry wafers and disks for quality control and assurance.

 Surface Roughness/Texture

Surface roughness measurements at the nanoscale are only possible with an atomic force microscope. With the appropriate vibration isolation enclosure, it is possible to measure surface textures under 0.1 nm.

 Step-Height Measurements  

The NP-AFM is a stylus profiler capable of making step height measurements from 0.3 to 500 nanometers. An included video microscope is essential for locating regions of interest for scanning.

Atomic Force Microscopes are essential for process development and control applications in advanced technology industries including data storage, semiconductor, advanced material, polymer and photonics.

Throughout the world, AFMWorkshop products are used everyday for nanotechnology research projects in both life and physical sciences.

The technology behind atomic force microscopes has been developed by pioneering scientists and engineers at leading technology firms, government labs, and universities throughout the world. AFMs continue to evolve and advance as scientists require higher resolution topographic scanning.

Atomic Force Microscope for Routine Scanning and Education

Basic Atomic Force Microscope for routine scanning and education: The B-AFM is a complete system that includes a computer with software, a stage, and control electronics; everything needed for AFM.

The TT-2 AFM is a high-resolution tabletop atomic force microscope capable of scanning nanoparticles, thin films, DNA, and other nanostructures. With a noise floor as low as 0.08 nm, the TT-2 AFM competes with the resolution of the highest-powered AFMs

AFMWorkshop has extensive experience manufacturing atomic force microscopes as well as training users on the operation of AFMs. With hundreds of customers worldwide, AFMWorkshop products have stood the test of time and used in a wide variety of applications.

The TT-2 AFM is a high-resolution tabletop atomic force microscope capable of scanning nanoparticles, thin films, DNA, and other nanostructures. With a noise floor as low as 0.08 nm, the TT-2 AFM competes with the resolution of the highest-powered AFMs.