Fast, non-destructive test for two-dimensional materials
By now it is well understood that thinning a material down to a single atom thickness can dramatically change that material's physical properties. Graphene, the best known 2D material, has unparalleled strength and electrical conductivity, unlike its bulk form as graphite. Researchers have begun to study hundreds of other 2D materials for the purposes of electronics, sensing, early cancer diagnosis, water desalination and a host of other applications. Now, a team of Penn State researchers in the Department of Physics and the Center for Two-Dimensional and Layered Materials (2DLM) has developed a fast, nondestructive optical method for analyzing defects in two-dimensional materials.
"In the semiconductor industry, for example, defects are important because you can control properties through defects," said Mauricio Terrones, professor of physics, materials science and engineering and chemistry, Penn State. "This is known as defect engineering. Industry knows how to control defects and which types are good for devices."
To really understand what is going on in a 2D material like tungsten disulfide, which has a single atom-thick layer of tungsten sandwiched between two atomic layers of sulfur, would require a high-power electron microscope capable of seeing individual atoms and the holes, called vacancies, where the atoms are missing.
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