Oxford instrument introduce handheld silicon drift about X-ray fluorescence apparatus of probe
X-MET5100 drift about probe (SDD) the intersection of Oxford and silicon of instrument And 45 kilovolts of strong X-ray tubes are combined together, has revealed the revolutionary break-through of the instrument in design. This kind of sophisticated technology has offered fast, high-accuracy measurement, and without can measure light elements such as magnesium, aluminium, silicon,etc. through accessory such as the complicated vacuum pump or helium potting, this is really handheld X-ray fluorescence (XRF) An analytic a great leap.
PMI measure trade, old and useless metal retrieve the trade, especially aircraft industry, there was firm walkie XRF light element testing tool which they have expect straight finally. X-MET5100 has guaranteed the analytic precision of laboratory quality of aluminium and titanium alloy, it is unparalleled to the sensibility when measure light metallic element that contains in metallic material such as copper, nickel and steel.
Silicon drift probe (SDD) , the strong combination of 45 kilovolts of X-ray tubes and analytical methods of the empirical coefficient, mean X-MET5100 can be within a short second, analyze and confirm the metal alloy composition accurately. Limited a material ' Heavy metallic element) , the micro- material in pollutant and ore in lead, soil in the toy can get accurate measurement, its high speed, there was not a possible one definitely in the past. Within several seconds, the trace element that can get ppm grade measures the result. X-MET5100 unparalleled speed and reliability guarantee high-efficient finding resulting in real time reliable.
It is said, X-MET5100 is the upgrading products used for daily multielement analytic X-MET5000 of instrument of Oxford, the latter succeeds in putting out earlier this year. These two instruments accord with IP54(NEMA 3) Authorize the requirement dustproofly and waterproofly, can bear the most harsh working condition.
X-MET5100 has already been succeeded in exhibiting at international titanium exhibitions and trade fairs of world aluminium of Essen, Germany in Las Vegas in September. It is estimated on the 11th of November of 2008- 13 in the intersection of Beijing and 2008 on International Conference Centre holds in ' On the fifth) Exhibit in China for the first time at the Chinese mining fair.
Q&A of reporter and Oxford instrument
1,Could you tell me whether this instrument could be used in the semiconductor, measure different growth layers (such as the epitaxial layer, gamma ray quantum well layer) Does the mixing the element of China even components include?
Thank you for your concern about the products of our company. Instrument this can measure the intersection of period of element and Mg about 28 clock element under U mark. So if your required element includes from the 12th to the 92nd between the elements in the periodic table of elements, and the content is between several or dozens of PPMs, there should not be too great problems. In addition can describe the shapes of different growth layers in detail? Including its rough composition content, appearance size and thickness,etc..
2,Such as saying, in the epitaxy structure of the green glow LED, it is necessary for us to measure indium (Indium) in InGaN multiple quantum well layer Component; Either ppm content of P-type or n type doping element in the source layer of other LED.
The element of PPM content rank can be examined, but can not make the analysis of microcell. Had better not demand atomic number of element examined less than 22, reach the intersection of PPM and rank to less than 22 No. the intersection of element and detectability of atomic number.
